The high resolution SWIR camera can be used for a very wide variety of applications including laser beam profiling, semiconductor inspection, hyperspectral imaging, on-line process control, Low-light level imaging, and screening solar cells.
Example: For solar cells screening, defects at early processing stage can be imaged through the bulk silicon thanks to its transparency at wavelengths beyond 1.1 micron.
Cracks, dead or weak responding areas are unveiled on sliced wafers, enabling automatic sorting / selection of the best pieces.
The camera finally captures faint electroluminescence (EL) and photoluminescence (PL) emissions from individual photovoltaic cells that are directly proportional to their efficiency.
PSL high resolution SWIR cameras are supplied with state of art SWIR optics which will deliver superior resolution / contrast modulation and lower distortion than conventional NIR optics that are used with conventional CCD cameras.

The high sensitivity cooled SWIR camera allows spectroscopic analysis up to 2.2 micron wavelength. It can be used for Photoluminescence, Raman Spectroscopy, Laser Diode Characterization, and Fluorescence. The camera relies on an efficient cooling with a delta T of 60 degree with respect to ambient temperature in order to reduce its dark current and allow extended integration periods.

PSL high sensitivity InGaAs short wave infrared (SWIR) cameras are also being used for monitoring temperature above 100 degree C of industrial furnaces and applications involving baking processes up to 1600 degree C.

It will unveil temperature gradients / defects of hot end glass parts and help monitoring cooling rate / reducing scrap respectively. Likewise it will also enable early detection of slag impurities in molten metal.

PSL high sensitivity SWIR cameras are provide with high efficiency transmission lenses.